The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, including total focusing method (TFM) imaging and advanced visualization capabilities, backed by its high image quality enable you to complete your inspection with greater confidence.
Confirm Your TFM Beam Coverage in Advance
The Acoustic Influence Map (AIM) tool provides you with an instant visual model of the sensitivity based on your TFM mode, probe, settings, and simulated reflector.
The AIM tool takes the guesswork out of creating your scan plan—visualize the effect of a wave set (TFM mode), see where sensitivity stops, and adjust your scan plan accordingly.
See What You’ve Been Missing with PCI
Our innovative amplitude-free live phase coherence imaging (PCI) improves small-defect sensitivity and penetration in noisy materials, all while easing your setup and simplifying sizing. Available on the OmniScan X3 64 flaw detector as of MXU 5.10.